名称: | |
描述: | |
公开/私有: | 公开 私有 |
Optical testing and metrology III : recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California / |
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ISBN/ISSN:
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0819403938 (pt. 1) |
中图分类法
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TN29-53 |
题名:
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Optical testing and metrology III [recent advances in industrial optical inspection : 8-13 July 1990, San Diego, California ] |
出版发行:
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Bellingham, Wash., USA : SPIE, c1990- |
载体形态:
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2 pts. : ill. ; 28 cm. |
附注:
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"Part of a six-conference program on Optical Design and Fabrication held at SPIE's International Symposium on Optical and Optoelectronic Applied Science and Engineering, 8-13 July 1990, San Diego, California"--P. x. |
主题词:
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Mensuration Congresses. |
主题词:
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Optical measurements Congresses. |
主要责任者:
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Grover, C. P. |
主要团体责任者:
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International Symposium on Optical and Optoelectronic Applied Sciences and Engineering |
其它题名:
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Recent advances in industrial optical inspection. |
标签:
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相关资源:
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分享资源:
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