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保存至书单:
Reliability physics 1982 : 20th annual proceedings / |
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中图分类法
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TN306-53 |
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中图分类法
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O59-53 |
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题名:
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Reliability physics 1982 [20th annual proceedings ] |
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出版发行:
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New York, N.Y. : IEEE, c1982. |
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载体形态:
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vii, 324 p. : ill., port. ; 28 cm. |
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主题词:
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Electronic apparatus and appliances Reliability |
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主题词:
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Electronic apparatus and appliances Testing |
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主题词:
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Integrated circuits Reliability |
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主题词:
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Integrated circuits Testing |
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HEA| |01423nam 2200361 a 4500 001| |021997014720 003| |CAL 005| |20050608175129.0 008| |970425s1982 nyua b 100 0 eng 010| |▼a 82640313 //r95▼z76180194 040| |▼aDLC▼cDLC 042| |▼alc▼ansdp 050|00|▼aTK7870▼b.S95 082|00|▼a621.381▼219 093| |▼aTN306-53▼24 093| |▼aO59-53▼23 099| |▼aCAL 022000340288 111|2 |▼aInternational Reliability Ph- | |ysics Symposium▼n(20th :▼d1982- | | :▼cSan Diego, Calif.) 245|10|▼aReliability physics 1982 :▼b- | |20th annual proceedings /▼cspo- | |nsored by IEEE Electron Device- | |s Society and IEEE Reliability Society. 260| |▼aNew York, N.Y. :▼bIEEE,▼cc1982. 300| |▼avii, 324 p. :▼bill., port. ;▼c28 cm. 504| |▼aIncludes bibliographical references. 650| 0|▼aElectronic apparatus and app- | |liances▼xReliability▼vCongresses. 650| 0|▼aElectronic apparatus and app- | |liances▼xTesting▼vCongresses. 650| 0|▼aIntegrated circuits▼xReliabi- | |lity▼vCongresses. 650| 0|▼aIntegrated circuits▼xTesting- | |▼vCongresses. 710|2 |▼aIEEE Electron Devices Society. 710|2 |▼aIEEE Reliability Group. 710|2 |▼aIEEE Reliability Society. 710|2 |▼aInstitute of Electrical and - | |Electronics Engineers.▼bElectr- | |on Devices Group. 950| |▼aJ▼fO59-53/I-59 998| |▼aSJT 999| |▼tC▼Atshs14▼a20050608 17:51:02- | |▼Mtshs14▼m20050608 17:51:29▼Gt- | |shs14▼g20050608 17:51:37
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