名称: | |
描述: | |
公开/私有: | 公开 私有 |
Reliability physics 1990 : 28th annual proceedings : New Orleans, Louisiana, March 27, 28, 29, 1990 / |
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中图分类法
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TN3-532 |
中图分类法
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O59-53 |
题名:
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Reliability physics 1990 [28th annual proceedings : New Orleans, Louisiana, March 27, 28, 29, 1990 ] |
出版发行:
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New York, N.Y. : Electron Device Society and Reliability Society of the Institute of Electrical and Electronics Engineers, c1990. |
载体形态:
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vi, 322 p. : ill. ; 28 cm. |
附注:
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"1990 International Reliability Physics Symposium."--T.p. verso. |
附注:
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"IEEE Catalog No. 90CH2787-0". |
主题词:
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Semiconductors Reliability Congresses. |
主题词:
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Integrated circuits Reliability Congresses. |
主题词:
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Electronic apparatus and appliances Reliability Congresses. |
标签:
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相关资源:
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分享资源:
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