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Reliability physics 1989 : 27th annual proceedings, Phoenix, Arizona, April 11, 12, 13, 1989 / |
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中图分类法
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TN306-53 |
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中图分类法
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O59-53 |
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题名:
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Reliability physics 1989 [27th annual proceedings, Phoenix, Arizona, April 11, 12, 13, 1989 ] |
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出版发行:
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New York : IEEE, c1989. |
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载体形态:
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v, 259 p. : ill. ; 29 cm. |
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主题词:
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Electronic apparatus and appliances Reliability |
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主题词:
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Electronic apparatus and appliances Testing |
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主题词:
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Integrated circuits Reliability |
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主题词:
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Integrated circuits Testing |
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标签:
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HEA| |01207nam 2200289 a 4500 001| |021997014702 003| |CAL 005| |20050608172859.0 008| |920722s1989 nyua b 100 0 eng d 040| |▼aPUL▼cPUL▼dSCT 093| |▼aTN306-53▼24 093| |▼aO59-53▼23 099| |▼aCAL 022000206774 111|2 |▼aInternational Reliability Ph- | |ysics Symposium▼n(27th :▼d1989- | | : ▼cPhoenix, Arizona) 245|10|▼aReliability physics 1989 :▼b- | |27th annual proceedings, Phoen- | |ix, Arizona, April 11, 12, 13,- | | 1989 /▼csponsored by the IEEE- | | Electron Devices Society and - | |the IEEE Reliability Society. 260| |▼aNew York :▼bIEEE,▼cc1989. 300| |▼av, 259 p. :▼bill. ;▼c29 cm. 504| |▼aIncludes bibliographical references. 650| 0|▼aElectronic apparatus and app- | |liances▼xReliability▼vCongresses. 650| 0|▼aElectronic apparatus and app- | |liances▼xTesting▼vCongresses. 650| 0|▼aIntegrated circuits▼xReliabi- | |lity▼vCongresses. 650| 0|▼aIntegrated circuits▼xTesting- | |▼vCongresses. 710|2 |▼aIEEE Electron Devices Society. 710|2 |▼aIEEE Reliability Society. 950| |▼aJ▼fO59-53/I-59 998| |▼aPUL 999| |▼tC▼Atshs14▼a20050608 17:28:35- | |▼Mtshs14▼m20050608 17:28:59▼Gt- | |shs14▼g20050608 17:29:16
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