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保存至书单:
Reliability physics, 1984 : 22nd annual proceedings / |
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中图分类法
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TN306-53 |
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中图分类法
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O50-53 |
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题名:
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Reliability physics, 1984 [22nd annual proceedings ] |
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出版发行:
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New York : Electron Devices and Reliability Societies of the IEEE, c1984. |
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载体形态:
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viii, 309 p. : ill. ; 28 cm. |
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主题词:
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Electronic apparatus and appliances Reliability |
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主题词:
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Electronic apparatus and appliances Testing |
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主题词:
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Integrated circuits Reliability |
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主题词:
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Integrated circuits Testing |
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HEA| |01207nam 2200289 a 4500 001| |021997014701 003| |CAL 005| |20050608172706.0 008| |970404s1984 nyua b 100 0 eng d 040| |▼cSJT 093| |▼aTN306-53▼24 093| |▼aO50-53▼23 099| |▼aCAL 022000327083 111|2 |▼aInternational Reliability Ph- | |ysics Symposium▼n(22nd ;▼d1984- | | :▼clas Vegas, Nev.) 245|10|▼aReliability physics, 1984 :▼- | |b22nd annual proceedings /▼csp- | |onsored by the IEEE Electron D- | |evices Society and the IEEE Re- | |liability Society. 260| |▼aNew York :▼bElectron Devices- | | and Reliability Societies of - | |the IEEE,▼cc1984. 300| |▼aviii, 309 p. :▼bill. ;▼c28 cm. 504| |▼aIncludes bibliographical references. 650| 0|▼aElectronic apparatus and app- | |liances▼xReliability▼vCongresses. 650| 0|▼aElectronic apparatus and app- | |liances▼xTesting▼vCongresses. 650| 0|▼aIntegrated circuits▼xReliabi- | |lity▼vCongresses. 650| 0|▼aIntegrated circuits▼xTesting- | |▼vCongresses. 710|2 |▼aIEEE Electron Devices Society. 710|2 |▼aIEEE Reliability Society. 950| |▼aJ▼fO59-53/I-59 998| |▼aSJT 999| |▼tC▼Atshs14▼a20050608 17:26:33- | |▼Mtshs14▼m20050608 17:27:06▼Gt- | |shs14▼g20050608 17:27:24
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