| 名称: | |
| 描述: | |
| 公开/私有: | 公开 私有 |
标签:
用空格间隔多个标签,如:小说 文学 余秋雨
保存至书单:
Reliability physics 1981 : 19th annual proceedings, April 7-9, 1981 / |
|
|
ISBN/ISSN:
|
0735-0791 |
|
中图分类法
:
|
TN306-53 |
|
中图分类法
:
|
O412-53 |
|
题名:
|
Reliability physics 1981 [19th annual proceedings, April 7-9, 1981 ] |
|
出版发行:
|
New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, 1981. |
|
载体形态:
|
310 p. : ill. ; 28 cm. |
|
附注:
|
Cover title: IEEE 1980 international reliability physics. |
|
主题词:
|
Electronic apparatus and appliances Reliability Congresses. |
|
主题词:
|
Electronic apparatus and appliances Testing Congresses. |
|
主题词:
|
Integrated circuits Reliability Congresses. |
|
主题词:
|
Integrated circuits Testing Congresses. |
|
标签:
|
|
|
相关资源:
|
|
|
分享资源:
|
|
限定所在馆:
限定所在馆藏地点:
限定馆藏状态:
HEA| |02176nas 2200493 4500 001| |021997014656 003| |CAL 005| |20050625153950.0 008| |780331c19709999nyuar1 1 a0eng 010| |▼a 82640313 ▼z 76180194 022|0 |▼a0735-0791 035| |▼aW102478-80 wl 040| |▼cEST 042| |▼alc▼ansdp 050|00|▼aTK7870▼b.S95 082|00|▼a621.381▼219 093| |▼aTN306-53▼23 093| |▼aO412-53▼23 099| |▼aCAL 021999665384 111|2 |▼aInternational Reliability Ph- | |ysics Symposium▼n(19th :▼d1981- | | :▼cOrlando) 210|0 |▼aReliab. phys. 222| 0|▼aReliability physics 245|10|▼aReliability physics 1981 :▼b- | |19th annual proceedings, April- | | 7-9, 1981 /▼cSponsored by the- | | IEEE Electron Device Group an- | |d the IEEE Reliability Group. 260| |▼aNew York, N.Y. :▼bElectron D- | |evices and Reliability Societi- | |es of the Institute of Electri- | |cal and Electronics Engineers,▼c1981. 300| |▼a310 p. :▼bill. ;▼c28 cm. 310| |▼aAnnual 362|1 |▼aBegan with vol. for 1970. 500| |▼aCover title: IEEE 1980 inter- | |national reliability physics. 504| |▼aIncludes bibliographical references. 510|1 |▼aIndex to IEEE publications▼x0099-1368 550| |▼aSponsored by: the IEEE Elect- | |ron Devices Society and the IE- | |EE Reliability Group, 1970- - | |; the IEEE Electron Devices Gr- | |oup and the IEEE Reliability G- | |roup, ＜1974-1978＞; the IEEE El- | |ectron Devices Society and the- | | IEEE Reliability Society, ＜1981-＞ 650| 0|▼aElectronic apparatus and app- | |liances▼xReliability▼xCongresses. 650| 0|▼aElectronic apparatus and app- | |liances▼xTesting▼xCongresses. 650| 0|▼aIntegrated circuits▼xReliabi- | |lity▼xCongresses. 650| 0|▼aIntegrated circuits▼xTesting- | |▼xCongresses. 710|2 |▼aIEEE Electron Devices Society. 710|2 |▼aIEEE Reliability Group. 710|2 |▼aIEEE Reliability Society. 710|2 |▼aInstitute of Electrical and - | |Electronics Engineers.▼bElectr- | |on Devices Group. 780|00|▼aReliability Physics Symposiu- | |m.▼tProceedings 950| |▼aJ▼fO412-53/I-59 950| |▼aFD▼fTN06-53/I59 998| |▼aEST 999| |▼tE▼Atshs13▼a20050625 15:39:37- | |▼Gtshs21▼g20050608 16:35:31▼Mt- | |shs13▼m20050625 15:40:10
- 温馨提示：只有“所在馆位置”为“社科自科借阅室、文学借阅室”且“馆藏状态”为“在馆”的图书才能借出，其他“馆藏地点”的书均不可借出。
- “所在图书馆”为“典阅室”的图书只能在室内阅览。
- 查询期刊“现刊架号”请查“报刊指南->期刊分类查询表”。