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25th annual proceedings reliability physics 1987 : San Diego, California, April 7, 8, 9, 1987 / |
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中图分类法
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TN306-53 |
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题名:
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25th annual proceedings reliability physics 1987 [San Diego, California, April 7, 8, 9, 1987 ] |
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出版发行:
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New York, NY : IEEE, c1987. |
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载体形态:
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viii, 279 p. : ill. ; 29 cm. |
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主题词:
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Electronic apparatus and appliances Reliability Congresses. |
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主题词:
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Electronic apparatus applicances Testing |
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主题词:
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Integrated circuits Reliability |
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HEA| |01100nam 2200265 a 4500 001| |021997014605 003| |CAL 005| |20050608143851.0 008| |930619s1987 nyua rb 100 0 eng d 010| |▼a 82640313 040| |▼aPUL▼cPUL 093| |▼aTN306-53▼23 099| |▼aCAL 022000216458 111|2 |▼aInternational Reliability Ph- | |ysics Symposium▼n(25th :▼d1987- | | :▼cSan Diego) 245|10|▼a25th annual proceedings reli- | |ability physics 1987 :▼bSan Di- | |ego, California, April 7, 8, 9- | |, 1987 /▼csponsored by the IEE- | |E Electron Devices Society and- | | the IEEE Reliability Society. 260| |▼aNew York, NY :▼bIEEE,▼cc1987. 300| |▼aviii, 279 p. :▼bill. ;▼c29 cm. 504| |▼aIncludes bibliographical references. 650| 0|▼aElectronic apparatus and app- | |liances▼xReliability▼xCongresses. 650| 0|▼aElectronic apparatus applica- | |nces▼xTesting▼vCongresses. 650| 0|▼aIntegrated circuits▼xReliabi- | |lity▼vCongresses. 710|2 |▼aIEEE Electron Divices Society. 950| |▼aJ▼fO4-53/I-61 998| |▼aPUL 999| |▼tC▼Atshs17▼a20050608 14:37:47- | |▼Mtshs17▼m20050608 14:38:51▼Gt- | |shs17▼g20050608 14:39:18
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