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AUTOTESTCON '89 conference record : "the systems readiness technology conference", Sept. 25-28, 1989, Adams Mark Hotel, City Line Avenue, Philadelphia, Pa. / |
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中图分类法
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TP274-53 |
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题名:
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AUTOTESTCON '89 conference record ["the systems readiness technology conference", Sept. 25-28, 1989, Adams Mark Hotel, City Line Avenue, Philadelphia, Pa. ] |
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出版发行:
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New York : Institute of Electrical and Electronics Engineers, c1989 |
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载体形态:
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357 p. : ill. ; 29 cm. |
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附注:
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"Automatic testing in the next decade & the 21st century" |
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主题词:
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Automatic checkout equipment Congresses. |
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HEA| |01154nam 2200253 4500 001| |021998011451 003| |CAL 005| |20050606091117.0 008| |981216s1989 nyua 10110/eng 040| |▼cSJT 093| |▼aTP274-53▼23 094| |▼a73.865083▼22 111|2 |▼aAUTOTESTCON▼d(1989 :▼cPhilad- | |elphia, Pa.) 245|10|▼aAUTOTESTCON \'89 conference r- | |ecord :▼b"the systems readines- | |s technology conference", Sept- | |. 25-28, 1989, Adams Mark Hote- | |l, City Line Avenue, Philadelp- | |hia, Pa. /▼cIEEE International- | | Automatic Testing Conference - | |; sponsored by the Institute o- | |f Electrica 260| |▼aNew York :▼bInstitute of Ele- | |ctrical and Electronics Engine- | |ers,▼cc1989 300| |▼a357 p. :▼bill. ;▼c29 cm. 500| |▼a"Automatic testing in the ne- | |xt decade & the 21st century" 504| |▼aIncludes bibliographical ref- | |erences and index 650| 0|▼aAutomatic checkout equipment- | |▼xCongresses. 710|2 |▼aIEEE Instrumentation and Mea- | |surement Society. 710|2 |▼aInstitute of Electrical and - | |Electronics Engineers. 950| |▼awhutl▼f73.865083/A939 998| |▼aSJT 999| |▼tC▼Atshs22▼a20050606 09:10:32- | |▼Mtshs22▼m20050606 09:11:17▼Gt- | |shs22▼g20050606 09:11:54
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