名称: | |
描述: | |
公开/私有: | 公开 私有 |
Automated testing for electronics manufacturing : ATE Seminar/Exhibit, January 30-February 1, 1978, L. A. Marriott, Los Angeles, CA : proceedings / |
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中图分类法
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TN06-53 |
题名:
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Automated testing for electronics manufacturing [ATE Seminar/Exhibit, January 30-February 1, 1978, L. A. Marriott, Los Angeles, CA : proceedings /] |
出版发行:
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[s.l.] : Benwill Pub. Corp., c1978. |
载体形态:
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142, [56] p. : ill. ; 29 cm. |
主题词:
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Automatic checkout equipment Congresses. |
主题词:
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Electronic apparatus and appliances Testing Congresses. |
主题词:
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Electronic industries Congresses. |
标签:
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相关资源:
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分享资源:
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HEA| |01101nam 2200289 450 001| |021998011427 003| |CAL 005| |20050606084840.0 008| |981216s1978 xx a 10010 eng 010| |▼a 78107851 020| |▼cRMB3.00 040| |▼a548 050|00|▼aTK7836▼b.A18 1978a 082|00|▼a621.38/028 093| |▼aTN06-53▼23 094| |▼a73.865083▼22 111|2 |▼aATE Seminar▼n(2nd :▼d1978 :▼- | |cLos Angeles) 245|10|▼aAutomated testing for electr- | |onics manufacturing :▼bATE Sem- | |inar/Exhibit, January 30-Febru- | |ary 1, 1978, L. A. Marriott, L- | |os Angeles, CA : proceedings /- | |▼corganized and produced by Ci- | |rcuits manufacturing magazine. 260| |▼a[s.l.] :▼bBenwill Pub. Corp.,▼cc1978. 300| |▼a142, [56] p. :▼bill. ;▼c29 cm. 650| 0|▼aAutomatic checkout equipment- | |▼xCongresses. 650| 0|▼aElectronic apparatus and app- | |liances▼xTesting▼xCongresses. 650| 0|▼aElectronic industries▼xCongresses. 710|2 |▼aCircuits manufacturing. 950| |▼awhutl▼f73.865083/A939 998| |▼aSJT 999| |▼tC▼Atshs22▼a20050606 08:47:37- | |▼Mtshs22▼m20050606 08:48:40▼Gt- | |shs22▼g20050606 08:49:12