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Proceedings,: Autotestcon 86, San Antonio, TX, September 8-11, 1986, IEEE International Automatic Testing Conference, Henry B. Gonzalez Convention Center, San Antonio, Texas / |
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中图分类法
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TP274-53 |
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题名:
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Proceedings, [Autotestcon 86, San Antonio, TX, September 8-11, 1986, IEEE International Automatic Testing Conference, Henry B. Gonzalez Convention Center, San Antonio, Texas ] |
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出版发行:
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New York, NY : IEEE ; , c1986. |
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载体形态:
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xiii, 415 p. : ill. ; 28 cm. |
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附注:
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Cover title: Autotestcon 86. |
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附注:
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"86CH2299-6." |
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主题词:
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Automatic checkout equipment Congresses. |
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其它题名:
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Autotestcon 86. |
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HEA| |01272nam 2200313 4500 001| |021998011415 003| |CAL 005| |20050606083222.0 008| |860214s1986 nyua b 10010 eng 010| |▼a 86080390 035| |▼aW129651-52 LY 040| |▼cEST 050|00|▼aTK7895.A8▼bA98 1986 082|00|▼a621.381/028/7▼219 093| |▼aTP274-53▼23 094| |▼a73.865083▼22 111|2 |▼aAutotestcon 86▼d(1986 :▼cSan- | | Antonio, Tex.) 245|10|▼aProceedings,▼bAutotestcon 86- | |, San Antonio, TX, September 8- | |-11, 1986, IEEE International - | |Automatic Testing Conference, - | |Henry B. Gonzalez Convention C- | |enter, San Antonio, Texas /▼cs- | |ponsored by the Institute of E- | |lectrical and Electronics Engi- | |neers ... [et al.]. 260| |▼aNew York, NY :▼bIEEE ;▼aPisc- | |ataway, NJ :▼bCopies from Orde- | |r Dept., IEEE,▼cc1986. 300| |▼axiii, 415 p. :▼bill. ;▼c28 cm. 500| |▼aCover title: Autotestcon 86. 500| |▼a"86CH2299-6." 504| |▼aIncludes bibliographical references. 650| 0|▼aAutomatic checkout equipment- | |▼xCongresses. 710|2 |▼aInstitute of Electrical and - | |Electronics Engineers. 740|0 |▼aAutotestcon 86. 950| |▼awhutl▼f73.865083/A939 998| |▼aEST 999| |▼tC▼Atshs22▼a20050606 08:30:09- | |▼Mtshs22▼m20050606 08:32:22▼Gt- | |shs22▼g20050606 08:32:58
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