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Autotestcon '82, October 12-14 : 1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio / |
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中图分类法
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TP274-53 |
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题名:
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Autotestcon '82, October 12-14 [1982 IEEE International Automatic Testing Conference, Dayton Convention Center, Dayton, Ohio ] |
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出版发行:
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New York, N.Y. (345 E. 47th St., New York 10017) : IEEE, c1982. |
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载体形态:
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ix, 592 p. : ill. ; 28 cm. |
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附注:
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"82CH1786-3" |
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附注:
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Pages 591-592 blank. |
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附注:
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Includes bibliographical references. |
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主题词:
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Automatic checkout equipment Congresses. |
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HEA| |01095nam 2200277 450 001| |021998010727 003| |CAL 005| |20050601173932.0 008| |981216s1982 nyua b 10010 eng 040| |▼a548 050|00|▼aTK7895.A8▼bA98 1982 082|00|▼a620/.0044▼219 093| |▼aTP274-53▼23 094| |▼a73.865083▼22 111|2 |▼aAUTOTESTCON▼d(1982 :▼cDayton, Ohio) 245|10|▼aAutotestcon \'82, October 12－－ | |14 :▼b1982 IEEE International - | |Automatic Testing Conference, - | |Dayton Convention Center, Dayt- | |on, Ohio /▼csponsored by the I- | |nstitute of Electrical and Ele- | |ctronic Engineers ... [et al.]. 260| |▼aNew York, N.Y. (345 E. 47th - | |St., New York 10017) :▼bIEEE,▼cc1982. 300| |▼aix, 592 p. :▼bill. ;▼c28 cm. 500| |▼a"82CH1786-3" 500| |▼aPages 591-592 blank. 500| |▼aIncludes bibliographical references. 650| 0|▼aAutomatic checkout equipment- | |▼xCongresses. 710|2 |▼aInstitute of Electrical and - | |Electronics Engineers. 950| |▼awhutl▼f73.865083/I61 998| |▼aSJT 999| |▼tC▼Atshs22▼a20050601 17:38:16- | |▼Mtshs22▼m20050601 17:39:32▼Gt- | |shs22▼g20050601 17:40:49
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