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X rays in materials analysis : novel applications and recent developments : 21-22 August 1986, San Diego, California / |
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ISBN/ISSN:
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0892527250 (pbk.) |
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中图分类法
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TN29-53 |
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题名:
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X rays in materials analysis [novel applications and recent developments : 21-22 August 1986, San Diego, California ] |
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出版发行:
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Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering, c1986. |
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载体形态:
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vi, 156 p. : ill. ; 28 cm. |
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丛编:
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Proceedings of SPIE--the International Society for Optical Engineering ; |
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主题词:
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Non-destructive testing |
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主题词:
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X-ray spectroscopy |
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主题词:
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Materials Testing |
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主要责任者:
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Rusch, Thomas William. |
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标签:
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HEA| |01383nam 2200325 a 4500 001| |021998009165 003| |CAL 005| |20050527092253.0 008| |860626s1986 waua b 101 0 eng u 010| |▼a 86061937 020| |▼a0892527250 (pbk.) 040| |▼cPUL 050|00|▼aTA417.2▼b.X23 1986 082|00|▼a620.1/127▼219 093| |▼aTN29-53▼23 094| |▼a71.22109▼22 099| |▼aCAL 022000212575▼aCAL 022000350587 245|00|▼aX rays in materials analysis- | | :▼bnovel applications and rec- | |ent developments : 21-22 Augus- | |t 1986, San Diego, California - | |/▼cThomas W. Rusch, chairman/e- | |ditor ; cooperating organizati- | |ons, Institute of Optics/Unive- | |rsity of Rochester ... [et al.]. 260| |▼aBellingham, Wash., USA :▼bSP- | |IE－－the International Society - | |for Optical Engineering,▼cc1986. 300| |▼avi, 156 p. :▼bill. ;▼c28 cm. 440| 0|▼aProceedings of SPIE－－the Int- | |ernational Society for Optical- | | Engineering ;▼vv. 690 504| |▼aIncludes bibliographical ref- | |erences and index. 650| 0|▼aNon-destructive testing▼vCongresses. 650| 0|▼aX-ray spectroscopy▼vCongresses. 650| 0|▼aMaterials▼xTesting▼vCongresses. 700|1 |▼aRusch, Thomas William. 710|2 |▼aSociety of Photo-optical Ins- | |trumentation Engineers. 950| |▼awhutl▼f71.22109/R951 998| |▼aPUL 999| |▼tC▼Atshs23▼a20050527 09:22:11- | |▼Mtshs23▼m20050527 09:22:53▼Gt- | |shs23▼g20050527 09:23:28
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