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保存至书单:
Optical characterization techniques for semiconductor technology : April 1-2, 1981, San Jose, California / |
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ISBN/ISSN:
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0892523093 (pbk.) |
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中图分类法
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TN3-53 |
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题名:
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Optical characterization techniques for semiconductor technology [April 1-2, 1981, San Jose, California ] |
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出版发行:
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Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, 1981. |
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载体形态:
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x, 262 p. : ill. ; 28 cm. |
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主题词:
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Semiconductors Testing Optical methods |
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主要责任者:
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Aspnes, D. E. |
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主要责任者:
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So, S. (Samuel S.) |
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主要责任者:
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Potter, Roy F. |
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标签:
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HEA| |01175nam 2200277 4500 001| |021997011838 005| |20050520144010.0 008| |820107s1981 waua b 10100 eng 010| |▼a 81051404 020| |▼a0892523093 (pbk.) 040| |▼aDLC▼cDLC▼dCIN 050|00|▼aTK7871.85▼b.O6 082|00|▼a621.3815/2/0287▼219 093| |▼aTN3-53▼23 245|00|▼aOptical characterization tec- | |hniques for semiconductor tech- | |nology :▼bApril 1-2, 1981, San- | | Jose, California /▼cD.E. Aspn- | |es, S. So, R.F. Potter, editors. 260| |▼aBellingham, Wash. :▼bSociety- | | of Photo-optical Instrumentat- | |ion Engineers,▼c1981. 300| |▼ax, 262 p. :▼bill. ;▼c28 cm. 490|0 |▼aProceedings of the Society o- | |f Photo-optical Instrumentatio- | |n Engineers▼vv. 276. 504| |▼aIncludes bibliographical ref- | |erences and indexes. 650| 0|▼aSemiconductors▼xTesting▼xOpt- | |ical methods▼vCongresses. 700|1 |▼aAspnes, D. E. 700|1 |▼aSo, S.▼q(Samuel S.) 700|1 |▼aPotter, Roy F. 830| 0|▼aProceedings of the Society o- | |f Photo-optical Instrumentatio- | |n Engineers▼vv. 276. 950| |▼aJ▼fTN3-53/S678 999| |▼tC▼Atshs14▼a20050520 14:39:19- | |▼Mtshs14▼m20050520 14:40:10▼Gt- | |shs14▼g20050520 14:40:19
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