名称: | |
描述: | |
公开/私有: | 公开 私有 |
2nd European Congress on Optics Applied to Metrology (METROP) : presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France / |
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ISBN/ISSN:
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0892522380 |
中图分类法
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TB9-53 |
题名:
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2nd European Congress on Optics Applied to Metrology (METROP) [presented as part of the Optics, Photonics, and Iconics Engineering Meeting (OPIEM), November 26-30, 1979, Strasbourg, France ] |
其它题名:
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Second European Congress on Optics Applied to Metrology (METROP) |
出版发行:
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Bellingham, Wash. : Society of Photo-optical Instrumentation Engineers, c1980. |
载体形态:
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x, 228 p. : ill. ; 28 cm. |
丛编:
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Proceedings of the Society of Photo-optical Instrumentation Engineers ; |
主题词:
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Optical measurements |
主题词:
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Holographic interferometry |
主题词:
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Speckle metrology |
主要责任者:
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Grosmann, Michel. |
主要责任者:
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Meyrueis, Patrick. |
主要团体责任者:
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Optics, Photonics, and Iconics Engineering Meeting |
标签:
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相关资源:
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分享资源:
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